ATR Silicon Crystals & Prisms


Attenuated Total Reflectance - silicon single crystals for neutron sources

Sil’tronix ST aims to manufacture silicon ATR Crystals on demand for different structural investigations: FTIR spectroscopy, ATR spectroscopy, IR spectroscopy, NMR spectroscopy, Raman spectroscopy, x-ray photoelectron spectroscopy, MRI spectroscopy, EPR Spectroscopy, and neutron experiments.

We produce our own monocrystalline silicon crystals from raw materials in order to insure the highest quality all along the manufacturing steps. It is also the best way to provide greater flexibility regarding our customer needs.

Since 45 years, the company has accumulated experiences on silicon crystallography to provide attenuated total reflectance crystals with the insurance to manufacture the best quality.

Single crystal standard dimensions:

  • 52 x 20 x 2mm 45° ATR Crystal
  • 80 x 10 x 4mm 45° ATR Crystal

Sil’tronix manufactures on demand silicon ATR Crystals for ATR FTIR spectroscopy and neutron experiments.

Standards tolerances:

  • Thickness: +/-0.2 mm
  • Angle: +/-0.01°
  • Surface quality of polished surfaces, scr/dig 80/50
  • Surface quality of ground surface, Ra 2.5
  • Surface accuracy, mm +/-0.01 deviation from ideal plane

Conventional Prisms for terahertz spectroscopy (All our THz prisms are manufactured upon request)


Examples of our know how: 

  • Prism with Brewster Angle: 25 x 14 x 18mm (73.98°)
  • Pair of prisms made of Si for pulse compression: 32.2° Apex angle, 100 mm longer side, 30 mm height
  • Equilateral prism: 12.7 x 12.7 x 12.7 mm
  • Equilateral prism: 32 mm x 32 mm x 32 mm

Core competences

  • Polishing on bevels
  • Polishing on edges


Silicon wafer stock


Silicon wafer configurator


SOI wafer configurator



Brochure Silicon wafers.pdf application/pdf

Brochure Thin silicon wafers.pdf application/pdf

Brochure Additional layers.pdf application/pdf

Brochure Services.pdf application/pdf