Application with Sil’tronix ST product: product application

Crystal characterized with X-ray topography from Sil’tronix ST and another supplier.

The topographers are recorded to a 20 keV photon energy and show a 40 mm long section of the 120 mm long crystals installed as a second crystal in a double crystal monochromator.

Both crystals show a very good crystallinity. The Si crystal from Sil’tronix ST is almost free of defects, while the one from the other supplier shows scratches on the surface, most probably due to the polishing process.

Image 1.pngSil’tronix ST crystal

Image 2.pngCompetitor crystal

Our manufacturing process allows to get a piece without strain hardening and a surface without any defect or scratch.

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