Sil'tronix product application (March)

Silicon dot comparison

For more than 40 years, Sil’tronix ST develops and manufactures valuable products regarding your specific needs.Charlotte-Le-Mesle-Photographe-Sil-Tronix-ST-Wafer-Sputtering-Target-1.png

For many years, Sil’tronix ST provides a large

quantity of silicon pieces for photonic applications.

Hereafter, you will find a comparison between a Sil’tronix ST competitor (named X) and the device we provide.


X sample

Sil'tronix ST.png

Sil'tronix sample

  1. Focus on the intensity provided

The device X shows an intensity within the range of 2 500 charges per minute. The silicon device we provide admits 300 000 charges per minute.

=> A larger amount of charges mean a greatest amount of (111) plans properly oriented with the Sil’tronix ST.

          2. (FWHM=full width at half maximum)

The FWHM is lower on the Sil’tronix ST product than the X one. It is the reason we have a better distinction for both peaks on the Sil’tronix ST sample than the X.

These two peaks come from K alpha and K beta lines produced by the copper target bombed through electrons to generate the X signal which is going to drop on the sample to analyse to be diffracted or not. In certain case, the line K is filtered in order to get only a peak (it is more intuitive). In any case there is still a trace of K, especially when the plate has a good quality.

> The result from the customer is a diffraction 100 times better than the X plate.


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