X-Ray Silicon Crystal

For more than 40 years, Sil'tronix Silicon Technologies produces its own monocrystalline silicon ingot in order to provide the highest quality for photonic applications. 

The whole Si crystals are made internally within our own factory in order to provide the flexibility requested regarding the application. We use exclusively pure silicon (9N) in order to maintain a reliable and qualitative consistency for X-ray crystallography. Our purpose is to make high value products regarding individual specification to meet every user's requirement with the highest quality level for X-ray diffraction analysis.

The production is all made internally to insure the quality and the flexibility all along the manufacturing process for low and medium volume.

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The surface x-ray diffraction has been experimented since long time to provide an excellent roughness <2Å rms.

We provide diffraction grating, single slit diffraction, monochromator, double axis diffraction grating, circular aperture, and mirrors aimed to condition primary X-ray beams or to analyze diffracted X-ray beams in multi-crystal diffraction arrangements.

Our silicon crystal blocks include: flat symmetrical of asymmetrical, channel-cut for multiple reflections, symmetrical or asymmetrical. The surface of flat crystals after mechanical finishing is treated by chemical-mechanical polishing, ensuring highest possible flatness and evenness of the surface for customized diffraction gratings.

Those silicon blocks are produced based on each customer’s specifications (size, roughness, orientation, and resistivity). Regarding the silicon crystal structure, the maximum size is a diameter of 15cm with a length of 20cm.

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Sil’tronix ST is able to produce many different diffraction patterns such as double slit, multiple slit, cicular aperture, grid, diffractive beam splitter, hexagonal crystal, …

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Sil’tronix ST unique know how

Our product line for synchrotron applications has an overwhelming market share due to our unique tooling and polishing techniques, which minimizes measurements background noise and aberrations as our basic tolerance is a Roughness <2Å rms.

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