Zero diffraction plate

X-ray crystallography

Sil’tronix ST, expert in the manufacturing of customized silicon crystals, aims to provide qualitative solutions for the X-ray diffraction analysis.

X-ray spectroscopy

Zero diffraction plates for X-Ray spectroscopy, also named Zero Background Holder are used for diffraction (XRD) analysis to insure a non-destructive analytical method.

The Zero Background Holders are made of 9N semiconductor grade silicon. The single crystals are generally used for powder analysis more or less condensed.

As an example, some customers use the Sil’tronix ST sample holders for protein analysis because there is no diffraction on X-rays.

Charlotte-Le-Mesle-Photographe-Sil-Tronix-ST-ZBH-1.pngCharlotte-Le-Mesle-Photographe-Sil-Tronix-ST-ZBH-Cavite-1.png

                                                                 Zero diffraction plate                                    Zero diffraction plate
                                                                        no cavity                                                         with cavity                           

They have been designed to be ideal for Rietveld analysis as they present practically no interference lines. The XRD pattern obtained, by using the crystals as background plate, is very “clean” (No diffraction on X-rays), so that even at very low-intensity, samples’ Bragg reflections can be easily detected.

We manufacture internally 2 types of silicon plate XRDon standard diameters and from customized specifications:Standard Flat sample holders (from 25,4 to 32 mm)

  • Standard sample holders with a front-loading shallow cavity where powder can typically be analyzed (from 25,4 to 32 mm)

Customized Specifications:

Crystal

Silicon, P-type B doped

Orientation

On request, (510), (911), (100)9°(001), …

Orientation accuracy

0.2°

Surface

Top side optical polished

Cavity diameter

8 mm, depth 0,2 mm

Min

Max.

Thickness

500 µm

5000 µm

Resistivity Ohms.cm

10

50

Diameter (mm)

10

48

Cavity zero diffraction plate is made of silicon cut with a special orientation in order to be invisible on x-rays:

  • All those values and parameters can be adjusted on customer’ request.
  • Perfect for sample holder of powder XRD , which has no background noise from 10 to 120 degree (2θ angle Cu Ka X-Ray).
  • Compatible with the majority of XRD equipment such as Siemens, Scinta, Bruker or Rugaku

Core competence

  • Customized manufacturing
  • No diffraction on X-rays
  • Orientation accuracy : 0.02°
  • Manufacture of different orientations: (510), (911), (100)9°(001),...

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