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Newsletter June

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In order to study the internal friction of thin films a nodal suspension system called GeNS (Gentle Nodal Suspension) has been developed. The key features of this system are: i) the possibility to use substrates easily available like silicon wafers; ii) extremely low excess losses coming from the suspension system which allows to measure Q factors in excess of 2x108 on 3” diameter wafers; iii) reproducibility of measurements within few percent on mechanical losses and 0.01% on resonant frequencies; iv) absence of clamping; v) the capability to operate at cryogenic temperatures. Measurements at cryogenic temperatures on SiO2 and at room temperature only on Ta2O5 films deposited on silicon are presented.

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The silicon wafer storage (or other materials) perfectly polished must be inventoried in controlled atmosphere area (Ideally in clean room) as soon as they are out from there double packaging sealed in clean room.

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The Czochralski (Cz) Pulling process to achieve Silicon wafers and Silicon crystals

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Have a look to our newsletter of March !

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The semiconductor industry is manufacturing chips that are included in all electronic devices, telephones, computer, television, watch industries, optics, photonics, micro sensors, MEMS, etc… 

To manufacture those devices in mass production, the starting raw material has been silicon since more than 45 years. Today, new materials are arriving in this industry, but silicon is still in first position.

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Join Sil'tronix Silicon Technologies from the 14th to the 16th of december 2016 at the Semicon Japan (Tokyo, Japan)

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Sil'tronix will be present Booth 414 at SEMICON EUROPA at Grenoble in October 2016

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In April's Newsletter, we emphasized the work of Dr. Ilio Miccoli from the 
University of Hannover. This month, we would like to encourage the work of the young start-up SiLiMiXT.

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You probably know Sil'tronix as a Silicon Wafer manufacturer. However, we are also recognized as a specialist of Si and Ge crystals/parts for X-Ray and Infrared applications.

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news

Newsletter June

Read more

In order to study the internal friction of thin films a nodal suspension system called GeNS (Gentle Nodal Suspension) has been developed. The key features of this system are: i) the possibility to use substrates easily available like silicon wafers; ii) extremely low excess losses coming from the suspension system which allows to measure Q factors in excess of 2x108 on 3” diameter wafers; iii) reproducibility of measurements within few percent on mechanical losses and 0.01% on resonant frequencies; iv) absence of clamping; v) the capability to operate at cryogenic temperatures. Measurements at cryogenic temperatures on SiO2 and at room temperature only on Ta2O5 films deposited on silicon are presented.

Read more

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