Sil'tronix Silicon Technologies
382 rue Louis Rustin
Technopole d'Archamps
74160 Archamps - France

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2 rue St Laurent, 38000 Grenoble
09 72 11 74 58


Charlotte Le Mesle Photographe


Crystal characterized with X-ray topography from Sil’tronix ST and another supplier.

The topographers are recorded to a 20 keV photon energy and show a 40 mm long section of the 120 mm long crystals installed as a second crystal in a double crystal monochromator.

Both crystals show a very good crystallinity. The Si crystal from Sil’tronix ST is almost free of defects, while the one from the other supplier shows scratches on the surface, most probably due to the polishing process.

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Silicon wafer Orientations

Silicon crystals are characterized by an orderly array of their atoms. In monocrystalline crystals, this arrangement is the same wherever the zone within the crystal.

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